Glass Materials
Glass-Ceramic
Quartz Glass / Fused Silica
Borosilicate Glass
Heat-Resistant Glass / High-Temperature Glass
Low Expansion Glass / Low-CTE Glass
Ultra-Thin Glass
Semiconductor Glass
Optical Glass
Glass Processing
Precision Etching / Chemical Etching
Glass CNC Machining
Glass Bonding
Double-Sided Processing (Grinding & Polishing)
Laser Processing / Laser Micromachining
Glass Cutting
Optical Coatings
Anti-Reflection (AR) Coating
Infrared (IR) Anti-Reflection Coating
Hydrophobic Coating & Indium Tin Oxide (ITO)
Metallized Coating / Metal Coating
Anti-Fingerprint (AF) Coating

Diamond Wire Cutting for Glass and Brittle Materials

Diamond wire cutting is mainly used when expensive or brittle materials need to be sliced with low kerf loss and reduced mechanical stress. A thin diamond-coated wire removes material by abrasive grinding, making it suitable for wafer slicing, plate cutting and blank preparation in fused silica, quartz crystal, sapphire, silicon, glass-ceramic, optical glass, CaF₂, germanium and scintillator crystals. This process is especially useful when the buyer needs to control slice thickness, TTV, warp, kerf loss and post-lapping allowance before polishing, coating or wafer inspection. Typical parts include sapphire wafers, quartz crystal plates, fused silica substrates, ZERODUR® mirror blanks, silicon wafers, CaF₂ lens blanks and detector crystal slices. We can support boule-to-wafer and block-to-plate cutting, with optional double-sided lapping, polishing, edge grinding, wafer inspection and clean packaging.

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Details Introduction

What Is Diamond Wire Cutting?

Diamond wire cutting is a precision slicing process in which a thin steel wire coated with electroplated or resin-bonded diamond abrasive particles is drawn continuously across the workpiece surface under controlled tension and feed rate, removing material through abrasive grinding action. The wire — typically 0.1 to 0.4 mm in diameter — travels at high speed (10 – 30 m/s) while the workpiece is fed slowly into the cutting plane, producing a slice with a kerf width only slightly larger than the wire diameter itself. Because the wire is extremely thin compared to conventional cutting tools, diamond wire cutting achieves the narrowest possible kerf among all contact cutting methods, minimizing material loss — a critical advantage when processing expensive substrates such as sapphire, optical crystals, and high-purity fused silica. Multi-wire configurations allow dozens of parallel slices to be produced simultaneously in a single pass, dramatically increasing throughput for wafer and plate production.

Process Capabilities

  • Wire Diameter: Ø0.10 – 0.40 mm (electroplated or resin-bonded diamond)
  • Kerf Width: 120 – 450 µm (wire diameter + diamond layer)
  • Minimum Slice Thickness: 0.3 mm (single wire); 0.5 mm (multi-wire)
  • Thickness Tolerance: ±20 µm (standard); ±10 µm (precision)
  • Surface Roughness (Ra): 0.5 – 2.0 µm (as-cut); ≤ 0.1 µm (post-lapped)
  • Maximum Workpiece Size: Ø300 mm × 400 mm length
  • Multi-Wire Capacity: Up to 100 simultaneous slices per pass

Compatible Materials

1Fused SilicaCorning 7980 / Tosoh ES-2000
2Quartz CrystalSynthetic / Natural — AT / BT cut
3SapphireC-plane / A-plane / R-plane
4SiliconFloat Zone / Czochralski — mono / poly
5Glass-CeramicZERODUR / PYROCERAM 9606
6Optical GlassBK7 / N-BK7 / LaK series
7Borosilicate GlassPYREX 7740 / BOROFLOAT 33
8Technical CeramicsAl₂O₃ / AlN / SiC
9CaF₂UV-grade / IR-grade
10GermaniumSingle crystal / Polycrystalline
11Scintillator CrystalsNaI / CsI / LYSO / BGO

Edge Quality & Finish

  • As-Cut Ra: 0.5 – 2.0 µm (electroplated wire, fine grit); 1.0 – 3.0 µm (resin-bonded)
  • Sub-Surface Damage Depth: 5 – 20 µm (removable by lapping)
  • Warp: ≤ 20 µm per 100 mm diameter (tension-controlled cutting)
  • TTV (Total Thickness Variation): ≤ 15 µm (standard); ≤ 5 µm (precision)
  • Edge Condition: As-cut; optional chamfer and edge grinding available
  • Post-Process Options: Double-sided lapping, polishing, AR coating, wafer inspection

Typical Applications

  • Sapphire Wafer Slicing: C-plane and A-plane sapphire boules sliced to LED and SiC substrate wafers
  • Optical Crystal Blanks: CaF₂, Ge, and scintillator crystal slicing for detector and lens blanks
  • Silicon Ingot Wafering: Mono and polycrystalline silicon slicing for solar and semiconductor
  • Quartz Crystal Plates: AT-cut and BT-cut resonator blanks from synthetic quartz bars
  • Fused Silica Plates: High-purity substrate plates for lithography and semiconductor tooling
  • Glass-Ceramic Slabs: ZERODUR mirror substrate blanks for precision optics and metrology

Custom Specifications

We accept custom diamond wire cutting orders for both boule-to-wafer and block-to-plate slicing, with full support for customer-supplied or in-house sourced raw material. Custom parameters include wire diameter selection, grit size, slice thickness, multi-wire pitch, and cutting fluid formulation for specific material compatibility. Integrated post-slicing services — including double-sided lapping, polishing, edge grinding, wafer inspection (TTV, warp, bow), and packaging in cleanroom-compatible carriers — are available as a complete substrate preparation workflow. All sliced substrates are delivered with full dimensional and surface quality documentation.

Kerf Loss Comparison: Cutting Method vs Material Loss

Kerf width and material loss per cut across four slicing methods — sapphire reference (Mohs 9) 0 500 1000 1500 2000+ Kerf Width / Material Loss per Cut (µm) Diamond Wire Cutting 120 – 200 µm ✓ Material yield: ~85% Abrasive Slurry Wire Saw 300 – 500 µm Material yield: ~65% Inner Diameter (ID) Saw 400 – 800 µm Material yield: ~55% Abrasive Waterjet 800 – 1500 µm Material yield: ~40% Up to 60% less waste Cost Impact Sapphire: ~\$50/cm³ Narrower kerf = direct saving Diamond Wire Cutting (this process) Alternative Methods

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